Electron Microscopy Archives

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Source: Accelerating Science•

Electron Microscopy Archives

Rogier Miltenburg is a biomedical engineer with >10 years of experience in Electron Microscopy. Rogier has held various roles, including application development and product management for both software and hardware related to electron microscopy. Throughout his career, he has specialized in…

Rogier Miltenburg is a biomedical engineer with >10 years of experience in Electron Microscopy. Rogier has held various roles, including application development and product management for both software and hardware related to electron microscopy. Throughout his career, he has specialized in translating complex technical innovations into strategic market solutions, driving product success by bridging the gap between advanced engineering and user needs.

About Lin Jiang

Dr. Lin Jiang is a Product Marketing Manager at Thermo Fisher Scientific specializing in automated transmission electron microscopy solutions for semiconductor metrology, helping manufacturers produce more efficient chips with higher yields. Lin has an extensive background in the TEM analysis of advanced materials, and is highly familiar with the characterization needs of both metallurgical and semiconductor industries. He received his PhD in Materials Science from Shanghai Jiao Tong University and performed post-doctoral work at UC Davis, UC Irvine, and Berkeley National Laboratory. Throughout his career, Lin Jiang has published over 80 papers in top journals like Nature Nanotechnology and Nature Communications.

Expertise and focus

Lin’s areas of focus include transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), semiconductor metrology, and other advanced materials characterization methods. His work reflects a strong interest in translating atomic-scale characterization into practical insights and more efficient scientific workflows.

For semiconductor applications, Lin has focused on advances in automated TEM metrology, including high-volume data acquisition, laboratory automation, and stronger integration of TEM workflows with semiconductor fabrication environments. His interests encompass the metrology challenges created by increasingly complex device architectures, including gate-all-around transistors, backside power delivery, continued 2D scaling, and 3D structures.

Scientific perspective

Lin’s scientific perspective centers on making atomic-scale information more accessible and actionable. Across semiconductor metrology and materials research, his work highlights the value of combining advanced microscopy with automation, high-quality data acquisition, and connected analytical workflows.

About Salomé Larmier

Dr. Salomé Larmier is a Sales Business Development Specialist at Thermo Fisher Scientific, supporting customers in their adoption of advanced electron microscopy solutions. Her background includes the use of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), and a variety of related materials characterization techniques for the investigation of complex geological materials.

Her doctoral research in petroleum geoscience focused on the characterization of natural hydraulic fractures in unconventional reservoirs, which has given her a strong foundation in geological characterization and data interpretation. She has a range of practical, hands-on experience with electron microscopy and microanalytical techniques that are actively being used in modern geoscience research.

Expertise and focus

Salomé specializes in electron microscopy and automated mineralogical techniques for geoscience applications. She has extensive experience applying automated mineralogy to reservoir characterization, mineral phase identification, and the analysis of heterogeneous geological materials. Her expertise in geological characterization encompasses SEM-EDS, automated mineralogy, as well as subsequent data interpretation.

She is involved in the development and adoption of automated mineralogy solutions across the full analytical process, from identifying customer needs and defining appropriate workflows to supporting data interpretation and technical guidance for specific geoscience applications.

Scientific perspective

Salomé’s perspective is shaped by both her background in petroleum geosciences and her practical experience with electron microscopy. She understands the challenges geoscientists face when translating mineralogical and microanalytical data into meaningful and actionable insight. She offers a unique perspective on how mineralogical information can be used to support decisions in exploration, reservoir characterization, and resource development.

She is intent on helping researchers and industry professionals connect analytical results to the specific questions they need to answer, facilitating more efficient and reliable characterization of complex geological materials.

About Dr. Anna Prokhodtseva

Dr. Anna Prokhodtseva is a Product Manager for FIB-SEM systems at Thermo Fisher Scientific. She has worked in electron microscopy for more than 15 years, with a technical foundation that includes focused ion beam methods, scanning electron microscopy, transmission electron microscopy, energy-dispersive spectroscopy, and electron backscatter diffraction. Her experience reflects deep engagement with the tools and techniques used to investigate material structure and behavior.

Expertise and focus

Anna has extensive hands-on experience preparing and analyzing samples for advanced imaging and microanalysis. During her doctoral research, she developed deep practical expertise using electron microscopy to study radiation damage and structural behavior in metals, including detailed work with transmission electron microscopy and focused ion beam techniques.

Following her PhD, Anna held a series of technical roles at Thermo Fisher Scientific, where she contributed directly to the development of new FIB-SEM products through close collaboration with research and development teams. Her experience includes transmission electron microscopy lamella preparation, focused ion beam tomography, atom probe specimen preparation, and the use of analytical methods such as electron backscatter diffraction and energy-dispersive spectroscopy. She also has experience with image analysis tools used in materials characterization. These capabilities enable her to understand how researchers utilize microscopy to investigate microstructure, defects, interfaces, and compositional variations in complex materials.

In her current role, Anna focuses on translating focused ion beam user needs into practical solutions that support real research challenges. This background allows her to understand how researchers use microscopy to study microstructure, defects, interfaces, and compositional variations in complex materials.

Scientific perspective

Anna’s perspective is shaped by years of collaboration with research and development teams and by her doctoral work in radiation damage in metals, which required detailed structural and compositional evaluation using electron microscopy. She understands the practical challenges researchers face when imaging and analyzing various materials, preparing samples, and combining complementary techniques. Her goal is to support customers as they work to obtain accurate and meaningful insight from their FIB-SEM and transmission electron microscopy data.

About Rosy Manser

Rosy Manser is a Manager in Product Marketing at Thermo Fisher Scientific. She is an experienced microscopy specialist with a background that spans light microscopy, X-ray imaging, and electron microscopy. Her scientific training includes doctoral work in preimplantation embryo development, where she used confocal microscopy to study cell fate and early developmental processes.

Expertise and focus

Rosy has worked with imaging approaches that reveal biological structure at multiple levels, from whole-cell organization to macromolecular complexes. Her experience provides her with a clear understanding of how different imaging modalities offer complementary information in life science research. In her current role, she focuses on the application of electron microscopy to biological questions in structural and cell biology and on the interpretation of imaging data in a biological context.

Scientific perspective

Rosy connects the capabilities of imaging systems to the scientific questions that life science researchers aim to answer. Her perspective reflects familiarity with the strengths and limitations of light, X-ray, and electron microscopy and how these tools contribute to the interpretation of biological structure and function. She brings this understanding to researchers who rely on imaging technologies to investigate complex biological systems.

About Mark Najarian

Mark Najarian is a Product Marketing Manager, Semiconductor at Thermo Fisher Scientific, specializing in next-generation semiconductor fab solutions. He has worked in the semiconductor industry for approximately twenty years, supporting advanced node development, yield ramp, failure analysis, and process monitoring. In his current role, he focuses on in-line wafer metrology products that integrate focused ion beam and scanning electron microscopy methods to meet the evolving needs of semiconductor manufacturing.

Mark Najarian earned a B.S. in Chemistry at the University of California, Santa Barbara, and an M.S. in Nanoscale Materials Science and Engineering at the University of California, Berkeley. He has been granted several patents enabling advances in 3D SEM metrology. He is a contributing author to research featured in Nature and Advanced Materials and is recognized as a leader in the global semiconductor metrology community.

Expertise and focus

Mark’s expertise includes semiconductor process development, in-line metrology, and defect analysis using combined imaging and analytical tools. He works with solutions that deliver high-resolution insights directly in the fab, enabling fast, accurate three-dimensional metrology and defect characterization. His background spans critical workflows such as cross-sectioning, angled milling, and volume tomography through sequential imaging and analysis, which support decision-making for advanced logic, memory, and packaging technologies.

Scientific perspective

Mark brings a perspective that integrates a practical understanding of physical defects with the technical capabilities of advanced metrology systems. He focuses on how automated three-dimensional measurement and defect analysis can accelerate time-to-yield, improve process control, and strengthen confidence in results at scale. His work reflects a deep familiarity with semiconductor challenges as device features shrink and integration complexity increases, and how in-fab analytical solutions contribute to addressing these challenges.

About Abhi Barve

Abhi Barve is Sr. Director and General Manager, Semiconductor at Thermo Fisher Scientific. His background spans automation solutions, semiconductor metrology, and technology strategy, with experience supporting the development of tools and workflows used in advanced device research and manufacturing. His work includes solution architecture, collaboration with research and development teams, and guiding product direction for semiconductor characterization systems.

Expertise and focus

Abhi’s expertise includes automated transmission electron microscopy, connected laboratory systems, and metrology workflows designed to deliver consistent and high-fidelity data at scale. He has worked across process development, yield learning, and advanced node characterization, applying knowledge of automation and analysis requirements to help shape solutions for semiconductor evaluation. His experience reflects a detailed understanding of how structural and compositional insight supports critical decisions in semiconductor technology development.

Technical perspective

Abhi brings a perspective that integrates technical understanding of semiconductor metrology with practical knowledge of how automated and integrated workflows improve efficiency and insight in both lab and fab environments. His work has addressed challenges such as scaling atomic-level characterization, improving data reliability, and aligning instrument capabilities with evolving requirements in device architecture and process control. He supports approaches that allow researchers and engineers to obtain robust analytical information needed for innovation in semiconductor manufacturing.

About Dominic Meusch

Dominic Meusch is a Global Director of Segment Strategy at Thermo Fisher Scientific. He has more than ten years of experience in biochemistry and biotechnology with a background that spans advanced life science workflows. His work draws on scientific knowledge and industry insight to support the development and adoption of technologies used in therapeutic discovery and development.

Expertise and focus

Dominic’s expertise includes market evaluation, workflow analysis, and the application of scientific understanding to guide product development. His background in biochemistry and biotechnology informs his work in identifying customer needs, evaluating emerging opportunities, and shaping solutions used across research and development settings. He has experience supporting commercialization activities and providing insight into how scientific workflows evolve in response to new methods and technologies.

Scientific perspective

Dominic brings a perspective that connects scientific principles with practical considerations in product design and workflow adoption. His understanding of life science applications helps inform decisions that support researchers working across complex stages of therapeutic development. He holds certifications in collaborative leadership and project management for biosafety which complement his scientific training.

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